Search results for: M. Nafría
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
Microelectronic Engineering > 2007 > 84 > 9-10 > 1956-1959
Microelectronic Engineering > 2007 > 84 > 9-10 > 2113-2116
Microelectronics Reliability > 2007 > 47 > 4-5 > 581-584
Microelectronic Engineering > 2007 > 84 > 3 > 501-505
Microelectronic Engineering > 2005 > 80 > Complete > 268-271
Microelectronics Reliability > 2005 > 45 > 5-6 > 811-814
Microelectronics Reliability > 2005 > 45 > 5-6 > 861-864
Microelectronic Engineering > 2004 > 72 > 1-4 > 29-33
Microelectronic Engineering > 2004 > 72 > 1-4 > 191-196
Microelectronics Reliability > 2003 > 43 > 8 > 1203-1209
Surface Science > 2003 > 532-535 > Complete > 727-731
Microelectronic Engineering > 2001 > 59 > 1-4 > 265-269
Solid State Electronics > 2001 > 45 > 8 > 1317-1325
Solid State Electronics > 2001 > 45 > 8 > 1327-1332
Microelectronics Reliability > 2001 > 41 > 7 > 1011-1013
Microelectronics Reliability > 2001 > 41 > 7 > 1077-1079
Microelectronics Reliability > 2001 > 41 > 7 > 1041-1044