Search results for: C. Dua
IEEE Electron Device Letters > 2016 > 37 > 5 > 629 - 632
Advanced Texts in Physics > Silicon Carbide > Devices > 839-868
Solid State Electronics > 2015 > 113 > Complete > 15-21
Microelectronics Reliability > 2014 > 54 > 9-10 > 2248-2252
Microelectronics Reliability > 2013 > 53 > 9-11 > 1476-1480
IEEE Electron Device Letters > 2012 > 33 > 7 > 985 - 987
Acta Physica Polonica A > 2011 > 120 > 5 > 924-926
physica status solidi c > 7 > 1 > 92 - 95
Physica B: Condensed Matter > 2009 > 404 > 23-24 > 4877-4879
Microelectronics Reliability > 2009 > 49 > 9-11 > 1216-1221