Search results for: Paul-Etienne Vidal
Microelectronics Reliability > 2012 > 52 > 6 > 1099-1104
Electrical Engineering > 2008 > 90 > 5 > 337-346
IEEE Transactions on Industrial Electronics > 2006 > 53 > 6 > 1799 - 1806
Microelectronics Reliability > 2012 > 52 > 6 > 1099-1104
Electrical Engineering > 2008 > 90 > 5 > 337-346
IEEE Transactions on Industrial Electronics > 2006 > 53 > 6 > 1799 - 1806