Search results for: D. Ielmini
Journal of Computational Electronics > 2017 > 16 > 4 > 1121-1143
2016 IEEE International Electron Devices Meeting (IEDM) > 21.6.1 - 21.6.4
2016 IEEE International Electron Devices Meeting (IEDM) > 4.3.1 - 4.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 16.8.1 - 16.8.4
2015 IEEE International Electron Devices Meeting (IEDM) > 7.6.1 - 7.6.4
2015 IEEE International Reliability Physics Symposium > 5B.3.1 - 5B.3.6
2014 IEEE International Electron Devices Meeting > 14.3.1 - 14.3.4
2014 IEEE International Electron Devices Meeting > 29.6.1 - 29.6.4
2014 IEEE International Electron Devices Meeting > 14.4.1 - 14.4.4
2014 IEEE International Reliability Physics Symposium > 5E.4.1 - 5E.4.6
2013 IEEE International Electron Devices Meeting > 21.7.1 - 21.7.3
2013 IEEE International Electron Devices Meeting > 22.1.1 - 22.1.4
2013 IEEE International Electron Devices Meeting > 31.5.1 - 31.5.4