Search results for: Jin-Kyu Jang
Microelectronic Engineering > 2010 > 87 > 3 > 517-521
Journal of Electronic Materials > 2009 > 38 > 12 > 2489-2495
Microelectronics Reliability > 2008 > 48 > 11-12 > 1882-1889
Microelectronic Engineering > 2010 > 87 > 3 > 517-521
Journal of Electronic Materials > 2009 > 38 > 12 > 2489-2495
Microelectronics Reliability > 2008 > 48 > 11-12 > 1882-1889