Search results for: E. Atanassova
Materials Science in Semiconductor Processing > 2015 > 29 > C > 345-350
Microelectronics Reliability > 2014 > 54 > 2 > 381-387
Microelectronics Reliability > 2012 > 52 > 4 > 642-650
Applied Surface Science > 2012 > 258 > 10 > 4507-4512
Materials Science in Semiconductor Processing > 2012 > 15 > 1 > 98-107
Microelectronics Reliability > 2011 > 51 > 12 > 2102-2109
Physica B: Physics of Condensed Matter > 2011 > 406 > 17 > 3348-3353
Thin Solid Films > 2011 > 519 > 22 > 8182-8190
Applied Surface Science > 2011 > 257 > 17 > 7876-7880
Microelectronic Engineering > 2011 > 88 > 3 > 305-313
Thin Solid Films > 2011 > 519 > 7 > 2262-2267
Materials Science in Semiconductor Processing > 2010 > 13 > 5-6 > 349-355
Microelectronic Engineering > 2010 > 87 > 11 > 2294-2300
Microelectronics Reliability > 2010 > 50 > 6 > 794-800
Microelectronic Engineering > 2010 > 87 > 4 > 668-676