Search results for: A. Paskaleva
Thin Solid Films > 2016 > 614 > PA > 7-15
Materials Science in Semiconductor Processing > 2016 > 44 > C > 30-37
Materials Science in Semiconductor Processing > 2015 > 29 > C > 124-131
Thin Solid Films > 2014 > 563 > Complete > 10-14
Microelectronics Reliability > 2014 > 54 > 2 > 381-387
Applied Surface Science > 2013 > 271 > Complete > 12-18
Microelectronics Reliability > 2012 > 52 > 4 > 642-650
Applied Surface Science > 2012 > 258 > 10 > 4507-4512
Materials Science in Semiconductor Processing > 2012 > 15 > 1 > 98-107
Microelectronics Reliability > 2011 > 51 > 12 > 2102-2109
Applied Surface Science > 2011 > 257 > 17 > 7876-7880
Microelectronic Engineering > 2011 > 88 > 3 > 305-313
Materials Science in Semiconductor Processing > 2010 > 13 > 5-6 > 349-355