Search results for: Weronika Walkosz
Springer Theses > Atomic Scale Characterization and First-Principles Studies of Si 13 N 4 InterfacesAtomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces > 97-100
Springer Theses > Atomic Scale Characterization and First-Principles Studies of Si 13 N 4 InterfacesAtomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces > 23-43
Springer Theses > Atomic Scale Characterization and First-Principles Studies of Si 13 N 4 InterfacesAtomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces > 1-10
Springer Theses > Atomic Scale Characterization and First-Principles Studies of Si 13 N 4 InterfacesAtomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces > 91-96
Springer Theses > Atomic Scale Characterization and First-Principles Studies of Si 13 N 4 InterfacesAtomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces > 11-21
Springer Theses > Atomic Scale Characterization and First-Principles Studies of Si 13 N 4 InterfacesAtomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces > 67-73
Springer Theses > Atomic Scale Characterization and First-Principles Studies of Si 13 N 4 InterfacesAtomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces > 75-89
Springer Theses
Surface Science > 2013 > 615 > Complete > 110-118
Ultramicroscopy > 2012 > 123 > Complete > 74-79
Surface Science > 2012 > 606 > 23-24 > 1808-1814