Springer Theses > Atomic Scale Characterization and First-Principles Studies of Si 13 N 4 InterfacesAtomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces > 23-43
Source
Abstract
Identifiers
series ISSN : | 2190-5053 |
series e-ISSN : | 2190-5061 |
book ISBN : | 978-1-4419-7816-5 |
book e-ISBN : | 978-1-4419-7817-2 |
DOI | 10.1007/978-1-4419-7817-2_3 |