Search results for: Yi-zheng Ye
Journal of Electronic Testing > 2011 > 27 > 1 > 43-56
Integration, the VLSI Journal > 2010 > 43 > 1 > 81-100
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 6 > 677 - 682
2007 International Conference on Machine Learning and Cybernetics > 5 > 2673 - 2677