Search results for: Wei Su
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 780 - 784
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3275 - 3281
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1644 - 1649
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 458 - 460
IEEE Electron Device Letters > 2014 > 35 > 7 > 690 - 692
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 229 - 233
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.1.1 - 5E.1.7
2011 International Reliability Physics Symposium > MY.8.1 - MY.8.5