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The soft defect localization on analog or mixed-mode ICs is becoming more and more challenging due to their increasing complexity and integration. New techniques based on dynamic laser stimulation are promising for analog and mixedmode ICs. Unfortunately, the considerable intrinsic sensitivity of this kind of devices under laser stimulation makes the defect localization results complex to analyze...
Dynamic laser stimulation techniques have been developed with success for failure analysis of integrated circuit subjected to ldquosoft defectrdquo. Weakness in design and physical defect can be isolated and located through these methodologies for digital, analog and mixed mode devices. But they are now successfully used embedded in qualification process since they provide accurate information about...
Dynamic optical techniques (light emission and laser stimulation techniques) are routinely used for precise IC defect localization. As device technology is more and more shrinking, developing new techniques for defect localization is becoming a crucial challenge. Dynamic Laser Stimulation (DLS) techniques based on near-infrared laser scanning are used for failure analysis, design debug and time margin...
Optical techniques (light emission and laser stimulation techniques) are routinely used to evaluate defects on specific component for space applications. Just one anomaly on one component could have catastrophic consequences on satellites. We must analyse any kind of fault of the device whatever the origin of this fault is. It can be design, design-process, process or end user related. At the early...
Optical techniques (light emission and laser stimulation techniques) are routinely used for precise IC defect localization. At the early stage of an analysis, choosing the right technique is an increasingly complex task. In some cases, one technique may bring value but no the others. Using an 180nm test structure device we present results showing the complementary of emission microscopy (EMMI), time-resolved...
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