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The authors present a short note describing the newly emerging optical side channel. The basic idea of the channel is very simple - many parts of the integrated circuits consist of transistors that represent one of the two logical states 0 or 1. When the state changes, there is some light that is emitted in the form of a few photons. A device employing the method which is able to detect these photons...
Dynamic optical techniques (light emission and laser stimulation techniques) are routinely used for precise IC defect localization. As device technology is more and more shrinking, developing new techniques for defect localization is becoming a crucial challenge. Dynamic Laser Stimulation (DLS) techniques based on near-infrared laser scanning are used for failure analysis, design debug and time margin...
Optical techniques (light emission and laser stimulation techniques) are routinely used to evaluate defects on specific component for space applications. Just one anomaly on one component could have catastrophic consequences on satellites. We must analyse any kind of fault of the device whatever the origin of this fault is. It can be design, design-process, process or end user related. At the early...
Optical techniques (light emission and laser stimulation techniques) are routinely used for precise IC defect localization. At the early stage of an analysis, choosing the right technique is an increasingly complex task. In some cases, one technique may bring value but no the others. Using an 180nm test structure device we present results showing the complementary of emission microscopy (EMMI), time-resolved...
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