Search results for: M. Vinet
Microelectronics Reliability > 2017 > 79 > C > 111-118
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4503 - 4509
IEEE Electron Device Letters > 2017 > 38 > 4 > 414 - 417
physica status solidi (b) > 254 > 3 > n/a - n/a