Search results for: J.H. Stathis
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-1.1 - DG-1.5
Microelectronics Reliability > 2010 > 50 > 9-11 > 1199-1202
Microelectronics Reliability > 2008 > 48 > 11-12 > 1759-1764
Microelectronics Reliability > 2007 > 47 > 4-5 > 665-668
Microelectronics Reliability > 2007 > 47 > 4-5 > 544-547
Microelectronics Reliability > 2006 > 46 > 2-4 > 270-286
Microelectronic Engineering > 2005 > 80 > Complete > 126-129
Microelectronic Engineering > 2004 > 72 > 1-4 > 34-38
Microelectronic Engineering > 2004 > 72 > 1-4 > 24-28
Microelectronic Engineering > 2004 > 72 > 1-4 > 45-49
Microelectronics Reliability > 2003 > 43 > 8 > 1193-1197