Search results for: P. Noé
Thin Solid Films > 2016 > 617 > PA > 44-47
physica status solidi (a) > 213 > 2 > 311 - 315
2013 IEEE International Electron Devices Meeting > 21.5.1 - 21.5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.9.1 - MY.9.5
2012 International Electron Devices Meeting > 18.7.1 - 18.7.4