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Deformations of metal interconnects, cracks in interlayer dielectrics and passivation layers in combination with plastic-packaging are still a major reliability concern for integrated circuit power semiconductors. In order to describe and understand the failure mechanism and its root cause, already a lot of work has been done in the past. However for the first time the impact of the edge profile of...
The paper describes the design challenges for a low-cost 3D Cu-TSV technology. Based on experimental characterization, we'll indicate the importance of extending the chip package co-design flow with thermo-mechanical simulations of the chip stack. We propose a new design flow hereto which leverages information captured by “smart mechanical samples” .
3D stacking of dies is a promising technique to allow miniaturization and performance enhancement of electronic systems. Key technologies for realizing 3D interconnect schemes are the realization of vertical connections, either through the Si-die or through the multilayer interconnections. The major bottleneck for 3D integration are thermal management issues due to the reduced thermal spreading in...
This paper presents a new generic methodology used to determine a parameterized compact thermal model for 3-D stacked integrated circuits (3D-SIC). The method allows to calculate the thermal distribution due to hot spots in the die stack. This approach is applied to different case studies of stacked dies configurations. In order to demonstrate the method, a fully generic non-uniform heat sources ??grid??...
3D integration architectures for microelectronic circuits have attracted much interest in the recent past, due to their capabilities for more efficient device integration and faster circuit operation. This type of assembly is formed by bonding multiple active layers through a dielectric material, and employs through-silicon vias for electrical interconnection. In this work we present the thermal analysis...
Full-chip dynamic electro-thermal simulation is achieved by coupling a circuit simulator and a thermal solver. By letting both simulations run with their specific time-step, a higher computational efficiency is achieved. A scheduler synchronizes temperatures in the circuit simulator and dissipation patterns in the thermal solver on an dasiaas-necessarypsila basis. The 3D geometry for the thermal solver...
As flexible electronic applications gain more and more research interests, the thermal management issues related to these become more critical. This paper quantifies the thermal resistance of flip chip interconnection on flexible substrate by both simulation and experimental measurements. For the simulation, both finite element method (FEM) and computational fluid dynamics (CFD) are used. Measurements...
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