Search results for: Hehe Hu
SID Symposium Digest of Technical Papers > 54 > 1 > 1477 - 1480
SID Symposium Digest of Technical Papers > 51 > 1 > 885 - 888
SID Symposium Digest of Technical Papers > 48 > 1 > 291 - 293
Microelectronics Reliability > 2016 > 63 > C > 148-151
IEEE Electron Device Letters > 2015 > 36 > 9 > 911 - 913
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4299 - 4303