Search results for: Xing Zhang
2014 IEEE International Reliability Physics Symposium > XT.14.1 - XT.14.4
IEEE Transactions on Electron Devices > 2012 > 59 > 7 > 1997 - 1999
IEEE Electron Device Letters > 2012 > 33 > 12 > 1687 - 1689
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 13 - 18
2010 3rd International Nanoelectronics Conference (INEC) > 1136 - 1137
IEEE Transactions on Electron Devices > 2008 > 55 > 3 > 816 - 826
IEEE Transactions on Electron Devices > 2008 > 55 > 11 > 2907 - 2917
IEEE Transactions on Electron Devices > 2008 > 55 > 11 > 2898 - 2906
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1288 - 1294
Solid State Electronics > 2006 > 50 > 2 > 263-267