Search results for: M. Lefeld-Sosnowska

Items from 1 to 20 out of 23 results

article

Investigation of oxide crystals by means of synchrotron and conventional X-ray diffraction topography

W. Wierzchowski, A. Malinowska, K. Wieteska, E. Wierzbicka, more

Materiały Elektroniczne > 2016 > T. 44, nr 4 > 17--32

X-ray diffraction topography, exploring both conventional and synchrotron sources of X-rays, has been widely used for the investigation of the structural defects in crystals of oxides. The majority of bulk oxide crystals have been grown by the Czochralski method from a melted mixture of high purity oxides. Some important oxide crystals like quartz and ZnO have been obtained by the hydrothermal method...

article

“Ghost” segregation pattern and ferroelectric domains in mixed calcium‐strontium‐barium niobates

W. Wierzchowski, K. Wieteska, A. Malinowska, E. Wierzbicka, more

X‐Ray Spectrometry > 44 > 5 > 356 - 362

The defect structure investigations of selected ferroelectric niobates such as Sr_xBa_1‐xNb₂O₆ (SBN), Ca_xBa_1‐xNb₂O₆ (CBN) and mixed (Ca_0.28Ba_0.72)_y(Sr_0.61Ba_0.39)_1‐yNb₂O₆ (CSBN) single crystals grown by the Czochralski method have been performed by means of synchrotron and conventional diffraction topography and scanning electron microscopy. A new characteristic phenomenon has been indicated in CSBN...

article

Characterization of crystal lattice defects in calcium molybdate single crystals (CaMoO₄) by means of X‐ray diffraction topography

E. Wierzbicka, A. Malinowska, K. Wieteska, W. Wierzchowski, more

X‐Ray Spectrometry > 44 > 5 > 351 - 355

Calcium molybdate CaMoO₄ crystals are perspective materials for many applications in acoustic‐electronics, acoustic‐optics and nonlinear optics. They are also used as laser hosts, scintillators, different kinds of substrates and active elements of ionizing radiation detectors. For all these applications large‐sized single crystals of high structural quality are required. The samples of CaMoO₄ crystals...

article

Synchrotron diffraction topography of SrxBa1−xNb2O6 (SBN), CaxBa1−xNb2O6 (CBN) and mixed (Ca0.28Ba0.72)y(Sr0.61Ba0.39)1−yNb2O6 (CSBN) crystals

K. Wieteska, W. Wierzchowski, A. Malinowska, M. Lefeld-Sosnowska, more

Radiation Physics and Chemistry > 2013 > 93 > Complete > 87-91

We present the results of synchrotron diffraction topographic investigations of SBN and CBN, as well as mixed strontium–calcium niobate CSBN crystals grown by means of the Czochralski method. The methods of characterisation included different complementary methods of conventional and synchrotron X-ray diffraction topography.Typical elements of the defect structure revealed in SBN and CBN crystals...

article

Synchrotron Diffraction topography in Studying of the Defect Structure in Crystals Grown by the Czochralski Method

W. Wierzchowski, K. Wieteska, A. Malinowska, E. Wierzbicka, more

Acta Physica Polonica A > 2013 > 124 > 2 > 350-359

The synchrotron diffraction topography had been widely used for investigation of the structural defects in crystals grown by the Czochralski method. Similarly as conventional diffraction topography, the synchrotron topography consists in recording with high spatial resolution of the beam formed by the Bragg reflection from the crystal. The advantages of synchrotron sources come from the possibilities...

article

X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method

M. Lefeld-Sosnowska, A. Malinowska

Acta Physica Polonica A > 2013 > 124 > 2 > 360-371

X-ray diffraction topography is one of basic diagnostics tools serving for visualisation of single crystal lattice defects. Defects of various kinds can be observed. The present study is a review of topographic results obtained in the X-ray laboratory of the Institute of Experimental Physics, University of Warsaw, for three families of single crystals grown by the Czochralski method: (i) silicon (Si)...

article

Synchrotron Topographic Studies of Domain Structure in Czochralski Grown Pr_xLa_{1-x}AlO_3 and Pr_xLa_{1-x-y}Mg_yAlO_3 Crystals

K. Wieteska, W. Wierzchowski, A. Malinowska, S. Turczyński, more

Acta Physica Polonica A > 2012 > 121 > 4 > 910-914

A domain structure and crystallographic defects in Czochralski grown single crystals of Pr_xLa_{1-x}AlO_3 and Pr_xLa_{1-x-y}Mg_yAlO_3 were characterised with a number of methods including conventional and synchrotron X-ray diffraction topography, and polariscopic micrography. The observed twin domain systems were located perpendicularly to 〈100〉_{pcub} and 〈110〉_{pcub} (pseudocubic) directions. It...

article

Characterisation of the Defect Structure in Gadolinum Orthovanadate Single Crystals Grown by the Czochralski Method

E. Wierzbicka, A. Malinowska, K. Wieteska, W. Wierzchowski, more

Acta Physica Polonica A > 2012 > 121 > 4 > 906-909

The GdVO_4 single crystals, both undoped and doped with erbium or thulium, were studied by means of X-ray diffraction topographic methods exploring laboratory and synchrotron radiation sources. Variously developed block structure, caused probably by thermal stresses, was revealed. The highest crystallographic perfection was observed in the crystal doped with 4 at.% of thulium, which was free of the...

article

Defect Structure Formed at Different Stages οf Growth Process in Erbium, Calcium and Holmium Doped YVO_{4} Crystals

A. Malinowska, E. Wierzbicka, M. Lefeld-Sosnowska, K. Wieteska, more

Acta Physica Polonica A > 2010 > 117 > 2 > 328-331

The defect structure of YVO_{4} single crystals doped with Er^{3+}, Ho^{3+} and Ca^{2+} were studied by X-ray diffraction topographic methods, using laboratory and synchrotron radiation sources. Variously developed block structure was the dominating imperfection of the investigated crystals observed both in conventional Lang and synchrotron topographs. The evaluation of block misorientation was realised...

article

X-ray Topographic Investigations of Domain Structure in Czochralski Grown Pr_{x}La_{1-x}AlO_{3} Crystals

K. Wieteska, W. Wierzchowski, A. Malinowska, S. Turczyński, more

Acta Physica Polonica A > 2010 > 117 > 2 > 268-271

In the present paper X-ray diffraction topographic techniques were applied to a number of samples cut from Czochralski grown Pr_{x}La_{1-x}AlO_{3} crystals with different ratio of praseodymium and lanthanum. Conventional and synchrotron X-ray topographic investigations revealed differently developed domain structures dependent on the composition of mixed praseodymium lanthanum aluminium perovskites...

article

White-beam synchrotron-radiation and conventional X-ray topography of GdCa4O(BO3)3:Y

J. Gronkowski, E. Wierzbicka, M. Lefeld-Sosnowska, J. Borowski, more

Radiation Physics and Chemistry > 2009 > 78 > 10 Supplement > S58-S63

The defect structure of gadolinium–calcium oxoborate single crystals highly doped with 22% Y, Gd _0.78 Y _0.22 Ca ₄ O(BO ₃ ) ₃ , is studied using X-ray transmission topography both with the conventional source and synchrotron radiation. Straight dislocation diffraction contrasts, white or black, depending on absorption and on its changing while the diffraction...

article

X-Ray Topographic Studies of Defect Structure in YVO_4 Crystals

K. Wieteska, W. Wierzchowski, T. Łukasiewicz, E. Wierzbicka, more

Acta Physica Polonica A > 2008 > 114 > 2 > 455-461

The perfection of YVO_4 crystals, which are predicted to replace formerly used YAG garnets due to higher quantum efficiency and lower excitation level, was studied. The investigations of Czochralski grown undoped YVO_4 single crystals were performed mainly by means of X-ray topographic methods. Both synchrotron and conventional X-ray sources were used. The study revealed relatively high density of...

article

Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO_4

A. Malinowska, M. Lefeld-Sosnowska, K. Wieteska, W. Wierzchowski, more

Acta Physica Polonica A > 2008 > 114 > 2 > 433-438

SrLaGaO_4 single crystals are perspective substrate materials for high temperature superconductors thin films, elements of thermal radiation receivers and other electronic devices. The defect structure of the Czochralski grown SrLaGaO_4 crystal was investigated by means of X-ray topography exploring both conventional and synchrotron sources. The crystal lattice defects in the core region of the crystal...

article

X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

A. Malinowska, M. Lefeld-Sosnowska, K. Wieteska, W. Wierzchowski, more

Journal of Crystal Growth > 2008 > 310 > 14 > 3398-3402

A Ca _0.5 Sr _0.5 NdAlO ₄ single crystal grown by the Czochralski method in the [100] direction was investigated by means of conventional projection X-ray topography, and by means of synchrotron white beam and monochromatic beam topography.The topographic investigation revealed growth striations with strong black diffraction contrasts distributed periodically in the form of concentric...

article

X-ray topography of SrLaGaO4 single crystals

A. Malinowska, M. Lefeld-Sosnowska, A. Pajączkowska, A. Kłos

Journal of Crystal Growth > 2006 > 290 > 1 > 149-155

Extended crystal lattice defects in tetragonal SrLaGaO ₄ single crystals were investigated by X-ray diffraction transmission and back reflection projection topography. The crystals were grown by the Czochralski technique using a [001]-oriented seed in nitrogen atmosphere with various oxygen contents. Crystals grown in atmosphere with higher oxygen content (7.5×10 ³ ppm) exhibited many...

article

Investigation of the defects distribution along the growth direction in GdCOB crystals by synchrotron and conventional X-ray topography

W. Wierzchowski, K. Wieteska, W. Graeff, E. Wierzbicka, more

Journal of Alloys and Compounds > 2005 > 401 > 1-2 > 69-74

The GdCa ₄ O(BO ₃ ) ₃ single crystals of monoclinic structure grown by the Czochralski technique were investigated by the synchrotron radiation white beam (SRWB) and conventional X-ray topography. The samples cut out parallel to the crystal growth axis b have been investigated in order to reveal the distribution of defects along the growth axis. Dislocations bundles, correlated...

article

Synchrotron white beam topography studies of SrLaGaO4 crystals

K. Wieteska, W. Wierzchowski, W. Graeff, M. Lefeld-Sosnowska, more

Journal of Alloys and Compounds > 2005 > 401 > 1-2 > 75-79

Strontium lantanum gallate SrLaGaO ₄ tetragonal single crystal was investigated by white beam synchrotron radiation topography. Projection and section topographs were taken in back reflection and transmission geometry. The central “core” crystal region was practically free of defects; only one extended “oval” defect with strong boundary contrast was observed. The strong white–black contrasts...

article

Conventional and synchrotron radiation back reflection topography of GdCa ₄ O(BO ₃ ) ₃ crystals

M. Lefeld-Sosnowska, E. Olszyńska, W. Wierzchowski, K. Wieteska, more

Journal of Alloys and Compounds > 2004 > 382 > 1-2 > 153-159

The investigations of GdCa ₄ O(BO ₃ ) ₃ single crystals grown by the Czochralski technique were performed by conventional and synchrotron radiation (SR) monochromatic wave topography mainly in back reflection geometry. It was found that back reflection topography is effectively able to reveal the dislocation structure even in thin samples. Different distribution of defects...

article

Extended defects in GdCa ₄ O(BO ₃ ) ₃ crystals

M. Lefeld-Sosnowska, E. Olszyńska, A. Pajączkowska, A. Kłos

Journal of Crystal Growth > 2004 > 262 > 1-4 > 388-394

Crystal lattice defects in GdCa ₄ O(BO ₃ ) ₃ (GdCOB) single crystals were investigated for the first time by transmission X-ray topography. Straight and curved dislocations were observed in samples cut perpendicular to the crystal growth axis b and parallel to it. A large, spherical inclusion was found in the sample cut perpendicular to the [010] growth axis. Bundles of dislocations...

article

Study of Si-Implanted and Thermally Annealed Layers of Silicon by Using X-ray Grazing Incidence Methods

D. Klinger, M. Lefeld-Sosnowska, J. Pełka, W. Paszkowicz, more

Acta Physica Polonica A > 2002 > 101 > 5 > 795-801

This paper reports on the study of structural modifications induced by the implantation process and by the subsequent thermal annealing in near-surface layers of Si single crystals implanted with Si^{2+} ions of energy 140 keV and doses from 1×10^{15} to 1× 10^{16} ions/cm^2. The grazing incidence X-ray diffraction and X-ray reflectivity measurements were applied to determine the thickness and structural...

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Keywords

61.72.FF (9)
X-RAY DIFFRACTION (4)
SYNCHROTRON RADIATION (3)
81.05.-T (2)
81.10.DN (2)
A1. X-RAY TOPOGRAPHY (2)
CRYSTAL LATTICE DEFECTS (2)
DISLOCATIONS (2)
X-RAY TOPOGRAPHY (2)
61.10.-I (1)
61.10.KW (1)
61.72.LK (1)
61.72.NN (1)
61.72.QQ (1)
61.72.TT (1)
68.35.FX (1)
81.40.EF (1)
81.65.MQ (1)
A1. DEFECTS (1)
A1. EXTENDED DEFECTS (1)
A1. SOLID SOLUTIONS (1)
A1. X-RAY TOPOGRAPHY B1. RARE EARTH OXYBORATES (1)
B1. TETRAGONAL STRONTIUM LANTANUM GALLATE (1)
B2. NONLINEAR OPTICAL MATERIALS (1)
CALCIUM BARIUM NIOBATE (1)
CRYSTAL GROWTH (1)
CRYSTAL LATTICE DEFECT STRUCTURE (1)
CZOCHRALSKI METHOD (1)
DEFECT STRUCTURE (1)
DEFECTS (1)
DEFEKTY SIECI KRYSTALICZNEJ (1)
DIFFRACTION TOPOGRAPHY (1)
DYFRAKCYJNA TOPOGRAFIA RENTGENOWSKA (1)
GD0.78Y0.22CA4O(BO3)3 (1)
INSULATORS (1)
LASER BEAM ANNEALING (1)
METODA CZOCHRALSKIEGO (1)
NON-LINEAR OPTICAL CRYSTALS (1)
NONLINEAR OPTICAL MATERIALS (1)
OXIDES (1)
RARE EARTH CALCIUM OXYBORATE (1)
SI:GE (1)
STRIATION (1)
STRONTIUM BARIUM NIOBATE (1)
STRONTIUM LANTHANUM GALLATE (1)
STRUCTURE AND EPITAXY (1)
THIN FILMS GROWTH (1)
X-RAY DIFFRACTION TOPOGRAPHY (1)
[JEL CLASSIFICATION CODES] 61.72 (1)
[JEL CLASSIFICATION CODES] 61.80.B (1)
[JEL CLASSIFICATION CODES] 68.55 (1)
[JEL CLASSIFICATION CODES] 81.15.A (1)
[PHYSICAL ASTRONOMY CLASSIFICATION SCHEME] 42.70 (1)
[PHYSICAL ASTRONOMY CLASSIFICATION SCHEME] 61.70J (1)
[PHYSICAL ASTRONOMY CLASSIFICATION SCHEME] 81.70J (1)
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Data set

Elsevier (10)
PSJD (10)
Wiley (2)
BazTech (1)

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Search results for: M. Lefeld-Sosnowska

Investigation of oxide crystals by means of synchrotron and conventional X-ray diffraction topography

“Ghost” segregation pattern and ferroelectric domains in mixed calcium‐strontium‐barium niobates

Characterization of crystal lattice defects in calcium molybdate single crystals (CaMoO₄) by means of X‐ray diffraction topography

Synchrotron diffraction topography of SrxBa1−xNb2O6 (SBN), CaxBa1−xNb2O6 (CBN) and mixed (Ca0.28Ba0.72)y(Sr0.61Ba0.39)1−yNb2O6 (CSBN) crystals

Synchrotron Diffraction topography in Studying of the Defect Structure in Crystals Grown by the Czochralski Method

X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method

Synchrotron Topographic Studies of Domain Structure in Czochralski Grown Pr_xLa_{1-x}AlO_3 and Pr_xLa_{1-x-y}Mg_yAlO_3 Crystals

Characterisation of the Defect Structure in Gadolinum Orthovanadate Single Crystals Grown by the Czochralski Method

Defect Structure Formed at Different Stages οf Growth Process in Erbium, Calcium and Holmium Doped YVO_{4} Crystals

X-ray Topographic Investigations of Domain Structure in Czochralski Grown Pr_{x}La_{1-x}AlO_{3} Crystals

White-beam synchrotron-radiation and conventional X-ray topography of GdCa4O(BO3)3:Y

X-Ray Topographic Studies of Defect Structure in YVO_4 Crystals

Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO_4

X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

X-ray topography of SrLaGaO4 single crystals

Investigation of the defects distribution along the growth direction in GdCOB crystals by synchrotron and conventional X-ray topography

Synchrotron white beam topography studies of SrLaGaO4 crystals

Conventional and synchrotron radiation back reflection topography of GdCa ₄ O(BO ₃ ) ₃ crystals

Extended defects in GdCa ₄ O(BO ₃ ) ₃ crystals

Study of Si-Implanted and Thermally Annealed Layers of Silicon by Using X-ray Grazing Incidence Methods

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