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Single-bit per word error protection is implemented on this LEON 3 fault tolerant processor. SEU data is reviewed and fault analysis is examined based on processor operation and operational environment.
Intrinsic and RadHard-by-Design hardness characterization has been performed on a 130 nm fab process. Hardness results from test chips produced in phase II of a NASA Goddard Space Flight Center contract are presented.
Perturbation methods are used to study the bifurcation of Couette flow to Taylor vortices in the presence of a small amount of suction flow through the inner cylinder. Taylor vortex flow is described as a small amplitude expansion of the velocity and pressure near the critical Gortler parameter. The suction flow modifies the critical Gortler number, stabilizing the original Couette flow.
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