Search results for: J.P. Xu
Microelectronics Reliability > 2008 > 48 > 5 > 693-697
Microelectronics Reliability > 2008 > 48 > 4 > 526-530
Marine Geology > 2008 > 248 > 3-4 > 193-212
Microelectronics Reliability > 2008 > 48 > 2 > 181-186
Electronics Letters > 2008 > 44 > 7 > 453 - 454
IEEE Electron Device Letters > 2008 > 29 > 10 > 1155 - 1158
Electronics Letters > 2008 > 44 > 18 > 1051 - 1052
Microelectronics Reliability > 2008 > 48 > 1 > 23-28
Microelectronic Engineering > 2007 > 84 > 9-10 > 2340-2343
Microelectronics Reliability > 2007 > 47 > 6 > 937-943
Microelectronics Reliability > 2007 > 47 > 2-3 > 391-394
Journal of Alloys and Compounds > 2007 > 427 > 1-2 > 46-49
IEEE Transactions on Electron Devices > 2007 > 54 > 11 > 3097 - 3102
Electronics Letters > 2007 > 43 > 24 > 1330 - 1332
Solid State Communications > 2006 > 140 > 11-12 > 514-518
Journal of Magnetism and Magnetic Materials > 2006 > 302 > 2 > 484-489
Marine Environmental Research > 2006 > 61 > 5 > 494-510
International Journal of Gynecology and Obstetrics > 2005 > 89 > 1 > 14-18