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In-field test of electronic devices is becoming increasingly important due to the wide adoption of electronic systems in safety-critical applications. Hence, it is crucial to devise and deploy effective solutions supporting the test during the operational phase of all the components of an electronic system, including the memory modules embedded in a SoC. Some key aspects include the possible reuse...
Thermal and electrical stress phases are commonly applied to automotive devices at the end of manufacturing test to give rise to early life latent failures. This paper proposes a new methodology to optimize the stress procedures during the Burn-In phase. In the proposed method, stress of CPU, RAM memory and FLASH memory are run in parallel using DMA and CACHE interventions. The paper reports also...
Speculative processors include performance oriented modules that improve the processor performance by exploiting speculation techniques in some time-consuming operations. The most common speculative modules in modern processors are branch prediction units, memory caches, load value speculation, and reorder buffers. Interestingly, about 40–50% of the processors area is devoted to these performance-oriented...
Software-based Self-Test (SBST) can be used during the mission phase of microprocessor-based systems to periodically assess the hardware integrity. However, several constraints are imposed to this approach, due to the coexistence of test programs with the mission application. This paper proposes a method for the generation of SBST programs to test on-line the Address Calculation Unit of embedded RISC...
Delay testing is crucial for most microprocessors. Software-based self-test (SBST) methodologies are appealing, but devising effective test programs addressing the true functionally testable paths and assessing their actual coverage are complex tasks. In this paper, we propose a deterministic methodology, based on the analysis of the processor instruction set architecture, for determining rules arbitrating...
Software-based self-test (SBST) is increasingly used for testing processor cores embedded in SoCs, mainly because it allows at-speed, low-cost testing, while requiring limited (if any) hardware modifications to the original design. However, the method requires effective techniques for generating suitable test programs and for monitoring the results. In the case of processor core testing, a particularly...
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