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In this paper, we present a thorough investigation of low frequency noise (LFN) and statistical noise variability through CMOS bulk technologies manufactured in STMicroelectronics along the past 12 years. The experimental results are well interpreted by the carrier number (CNF) with correlated mobility (CMF) fluctuation model. This enabled us to plot the evolution with time and technology generation...
Self-heating is evaluated in high-voltage devices from a 0.13 mum thin-film SOI CMOS technology. Our measurement procedure is described. The influence of different parameters such as layout variations is finally investigated, and main results are shown here. A strong linear correlation between the thermal resistance and the reverse of the active surface is demonstrated. Besides, a moderate impact...
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