Search results for: J. Chen
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2592 - 2598
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 432 - 437
IEEE Electron Device Letters > 2016 > 37 > 11 > 1458 - 1461
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2469 - 2473