Search results for: Hui Chen
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3167 - 3173
IEEE Electron Device Letters > 2017 > 38 > 7 > 835 - 838
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 475 - 478
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 651 - 656
IEEE Electron Device Letters > 2013 > 34 > 10 > 1229 - 1231
2008 Congress on Image and Signal Processing > 1 > 85 - 89