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Due to the use of scaled technologies, high levels of integration and high speeds of today's mixed-signal SoCs, the problem of validating correct operation of the SoC under electrical bugs and that of debugging yield loss due to unmodeled multi-dimensional variability effects is extremely challenging. Precise simulation of all electrical aspects of the design including the interfaces between digital...
One of the factors now beginning to seriously limit clock rates in large synchronous designs is manufacturing variations in device parameters. Moreover, such random process variations are increasing significantly with device scaling as technology approaches the end of the silicon roadmap. In a large design containing several millions of transistors, virtually every manufactured part will have a few...
In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on system level performance. For power optimization in such applications, voltage overscaling can be used to operate the arithmetic circuitry slower than the critical circuit path delay while incurring tolerable SNR...
We present a detailed understanding of filamentation, through rigorous mixed-mode 3D simulation in a nano-meter scale drain-extended NMOS (DE-NMOS). Localization is first triggered in the 2D plane due to regenerative turn-on of the parasitic bipolar. 3D Simulations performed by adding width along the Z-axis (i.e., W) show a very prominent localization effect, which leads to electro-thermal runaway...
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