Search results for: J. Liu
2016 IEEE International Electron Devices Meeting (IEDM) > 9.6.1 - 9.6.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-1-1 - 4B-1-5
IEEE Electron Device Letters > 2016 > 37 > 4 > 516 - 518
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341
IEEE Electron Device Letters > 2011 > 32 > 4 > 467 - 469
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2177 - 2181
IEEE Electron Device Letters > 2011 > 32 > 2 > 128 - 130
2010 International Electron Devices Meeting > 27.5.1 - 27.5.4
2010 International Electron Devices Meeting > 11.6.1 - 11.6.4
IEEE Electron Device Letters > 2010 > 31 > 10 > 1143 - 1145