Search results for: J. Geypen
2016 IEEE International Electron Devices Meeting (IEDM) > 19.7.1 - 19.7.4
2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
Journal of Materials Science > 2012 > 47 > 18 > 6497-6504
2016 IEEE International Electron Devices Meeting (IEDM) > 19.7.1 - 19.7.4
2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
Journal of Materials Science > 2012 > 47 > 18 > 6497-6504