Search results for: F. Ito
2012 International Electron Devices Meeting > 33.7.1 - 33.7.4
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105
IEEE Transactions on Semiconductor Manufacturing > 2008 > 21 > 3 > 469 - 480
IEEE Transactions on Electron Devices > 2007 > 54 > 8 > 1867 - 1877