Search results for: T. Hayashi
IEEE Electron Device Letters > 2007 > 28 > 10 > 868 - 870
Journal of Electronic Materials > 1999 > 28 > 3 > 180-185
Materials Chemistry and Physics > 1998 > 54 > 1-3 > 49-53
IEEE Electron Device Letters > 2007 > 28 > 10 > 868 - 870
Journal of Electronic Materials > 1999 > 28 > 3 > 180-185
Materials Chemistry and Physics > 1998 > 54 > 1-3 > 49-53