Search results for: Jeffrey S. Fu
Microwave and Optical Technology Letters > 54 > 5 > 1196 - 1200
Microelectronics Reliability > 2012 > 52 > 1 > 147-150
Microelectronics Reliability > 2011 > 51 > 12 > 2137-2142
Microelectronics Reliability > 2011 > 51 > 12 > 2163-2167
TENCON 2011 - 2011 IEEE Region 10 Conference > 616 - 617
TENCON 2011 - 2011 IEEE Region 10 Conference > 1240 - 1241
AEUE - International Journal of Electronics and Communications > 2011 > 65 > 9 > 763-766
IEEE iWEM2011 > 89 - 93
IEEE iWEM2011 > 99 - 103
Microelectronics Reliability > 2011 > 51 > 8 > 1337-1341
Microwave and Optical Technology Letters > 53 > 6 > 1389 - 1394
Microwave and Optical Technology Letters > 53 > 5 > 1131 - 1134
Microelectronics Reliability > 2011 > 51 > 2 > 381-385
Microwave and Optical Technology Letters > 53 > 3 > 485 - 488