Search results for: M. Liu
2016 IEEE International Electron Devices Meeting (IEDM) > 31.4.1 - 31.4.4
IEEE Transactions on Nuclear Science > 2015 > 62 > 3-3 > 1336 - 1340
2015 IEEE International Reliability Physics Symposium > 2F.2.1 - 2F.2.5
Journal of Thermal Analysis and Calorimetry > 2003 > 73 > 3 > 977-986