Search results for: N.G. Rudawski
Microelectronics Reliability > 2017 > 70 > C > 41-48
Journal of Power Sources > 2013 > 223 > Complete > 336-340
Microelectronics Reliability > 2012 > 52 > 11 > 2542-2546
Materials Letters > 2011 > 65 > 23-24 > 3540-3543
Thin Solid Films > 2011 > 519 > 18 > 5962-5965
Nuclear Inst. and Methods in Physics Research, B > 2011 > 269 > 1 > 20-22
Scripta Materialia > 2009 > 61 > 3 > 327-330
Journal of Electronic Materials > 2009 > 38 > 9 > 1926-1930
Materials Science & Engineering R > 2008 > 61 > 1-6 > 40-58