Search results for: M.R. Holzworth
Microelectronics Reliability > 2017 > 70 > C > 41-48
Microelectronics Reliability > 2017 > 70 > C > 32-40
Journal of Power Sources > 2013 > 223 > Complete > 336-340
Microelectronics Reliability > 2012 > 52 > 11 > 2542-2546
Microelectronics Reliability > 2012 > 52 > 1 > 23-28