Search results for: Yu Lin
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 8 > 1274 - 1286
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-1.1 - CR-1.4
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 531 - 536
IEEE Transactions on Communications > 2016 > 64 > 1 > 130 - 140
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 775 - 777
2011 International Reliability Physics Symposium > EL.2.1 - EL.2.2
Analog Integrated Circuits and Signal Processing > 2003 > 37 > 2 > 123-132