Search results for: Amit Kumar Singh
Measurement > 2017 > 109 > C > 27-35
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 11 > 3359 - 3372
Measurement > 2017 > 109 > C > 27-35
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 11 > 3359 - 3372