Search results for: C. Key Chung
Microelectronics Reliability > 2016 > 65 > C > 173-177
Journal of Electronic Materials > 2015 > 44 > 2 > 744-750
Journal of Electronic Materials > 2013 > 42 > 6 > 1254-1259
Journal of Alloys and Compounds > 2012 > 539 > Complete > 57-62
Thin Solid Films > 2012 > 520 > 16 > 5346-5352
Acta Materialia > 2012 > 60 > 11 > 4586-4593
Scripta Materialia > 2010 > 63 > 2 > 258-260