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The standard multivariate metrics for semiconductor product yield estimation and prediction in production processes usually assume that the parameters contributing to the yield are all normally distributed. However, the data met in production processes is not always multivariate normal. A variety of methods has been developed for multivariate non-normal data, but these usually rely on no statistical...
The standard metrics for integrated circuits' analysis and characterization in production processes usually assume that the process under investigation is characterized by a normal distribution. However, the data met in practice are not always normal and the yield estimates may be inaccurate. In this paper we propose estimating the yield by using a distribution fitting flow. The selected distribution...
The modern electronic systems have become very complex with a high number of potential factors that may affect the systems' behavior. Sensitivity analysis may be employed to simplify the analysis of such systems and identify the most important factors upfront. The paper introduces two new sensitivity analysis methods based on the measure of entropy, which overcome the limitation of several state-of-the-art...
On top of assessing the specification compliance, it is also important to verify the behavior and performance of the electronic components in the targeted application. This is usually achieved by jointly simulating the component and the application. There is a particular interest in finding the application yield caused by the process variation of the electronic component. The cost of the experiments...
The paper focuses on treating and characterizing variations that occur in measurements or that are intrinsic in electronic systems. Methods illustrating basic principles of Design of Experiments such as replication and blocking are implemented and used so that valid and objective conclusions are drawn. Replication is used for three purposes: verifying the metamodel adequacy, defining the confidence...
We describe an assay for testing the response of the adult red- legged earth mite, Halotydeus destructor, to pesticides. This assay is used to generate dose response curves for an organophosphate (omethoate) and an organochlorine (endosulphan) commonly used to control these mites, as well as a synthetic pyrethroid (alfamethrin). Comparisons of the populations from five sites around Victoria indicated...
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