Search results for: Jongyeon Kim
Proceedings of the IEEE > 2015 > 103 > 1 > 106 - 130
2014 IEEE International Electron Devices Meeting > 12.5.1 - 12.5.4
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3737 - 3743
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.4.1 - MY.4.6