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Chip scale terahertz dielectric waveguides, consisting out of high resistivity silicon as a core material have been fabricated. The waveguide loss is measured to be ∼1dB/cm at both 1 THz and 2.5 THz.
Far-field terahertz imaging is limited by diffraction to low resolutions in the 50 μm range. On the other hand, near-field optical nanoscopy is a recent technique that shows permittivity contrasts at the nanoscale. We present here images of graphene layers on SiO2 obtained by scattering scanning near-field nanoscopy at 2.5 THz that show high contrasts.
This paper reports on performances enhancement of photoconductive switches in term of On/Off ratio and insertion losses. The optimization parameters on which the research has been focused are gap dimensions reduction to nanometer scale. The device characterization results up to a microwave frequency of 40 GHz and under CW illumination at a wavelength of 800 nm are presented. On/Off ratio reveals a...
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