Search results for: Chenming Hu
2016 IEEE International Electron Devices Meeting (IEDM) > 30.5.1 - 30.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 14.3.1 - 14.3.4
Compact Modeling > Modeling of Multiple Gate MOSFETs > 395-429
2015 IEEE International Electron Devices Meeting (IEDM) > 27.3.1 - 27.3.4
2015 IEEE International Electron Devices Meeting (IEDM) > 32.2.1 - 32.2.4
2015 IEEE International Electron Devices Meeting (IEDM) > 22.6.1 - 22.6.4