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Field Programmable Gate Arrays (FPGAs) gain popularity as higher-level tools evolve to deliver the benefits of re-programmable silicon to engineers and scientists at all levels of expertise. In order to use FPGAs efficiently, new CAD tools and modern architectures are needed for the growing demands of heterogeneous computing paradigms. Overlay architectures have become a popular option to support...
Reassuring fault tolerance in computing systems that contain FPGA devices is the most important problem for mission critical space components. With the rise in interest of commercial SRAM-based FPGAs, it is crucial to provide runtime reconfigurable recovery from a failure. In this paper, we propose a superimposed virtual coarse-grained reconfigurable architecture, embedded with on-demand three level...
Functional errors and bugs inadvertently introduced at the RTL stage of the design process are responsible for the largest fraction of silicon IC re-spins. Thus, comprehensive functional verification is the key to reduce development costs and to deliver a product in time. The increasing demands for verification led to an increase in FPGA-based tools that perform emulation. These tools can run at much...
The most important step in the final testing of fabricated ASICs or the functional testing of ASIC and FPGA designs is the generation of a complete test set that is able to find the possible errors in the design. Automatic Test Pattern Generation (ATPG) is often done by fault simulation which is very time-consuming. Speed-ups in this process can be achieved by emulating the design on an FPGA and using...
This paper proposes the use of parameterised FPGA configurations for a new test set generation approach. The time-consuming problem of test set generation aims at finding the right input values to fully test an ASIC design. Since well-known methods for test set generation such as fault simulation techniques have become impractical to use due to their speed limitations, FPGAs have been used in order...
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