Search results for: F. M. Puglisi
2016 IEEE International Electron Devices Meeting (IEDM) > 34.8.1 - 34.8.4
IEEE Electron Device Letters > 2015 > 36 > 10 > 1030 - 1032
2014 IEEE International Reliability Physics Symposium > MY.5.1 - MY.5.5
2014 IEEE International Reliability Physics Symposium > GD.4.1 - GD.4.4