Search results for: Shang-Pin Ying
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2843 - 2848
Microelectronics Reliability > 2013 > 53 > 12 > 1916-1921
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2843 - 2848
Microelectronics Reliability > 2013 > 53 > 12 > 1916-1921