Search results for: Chih-Ting Yeh
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 536 - 544
2013 IEEE International Reliability Physics Symposium (IRPS) > EL.2.1 - EL.2.6
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1011 - 1018
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 3 > 178 - 182
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2626 - 2634
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3456 - 3463