Search results for: F. Soci
Microelectronics Reliability > 2015 > 55 > 9-10 > 1662-1666
Microelectronics Reliability > 2014 > 54 > 9-10 > 2222-2226
Microelectronics Reliability > 2013 > 53 > 9-11 > 1461-1465
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.6.1 - 3C.6.6
Microelectronics Reliability > 2012 > 52 > 9-10 > 2153-2158
2012 IEEE International Reliability Physics Symposium (IRPS) > CD.2.1 - CD.2.4
Electronics Letters > 2010 > 46 > 4 > 296 - 298