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In recent work, the error latching probability due to an SET is calculated for a single observable point, and this help in hardening the design. This paper utilizes a recently proposed probabilistic framework for SET propagation in order to diagnose the location and time of strike based on errors observed at multiple points. The proposed diagnostic framework requires a new approach to calculate the...
A novel method is proposed to enhance SET propagation probability and it is shown how it can assist the hardening process. This paper provides a method to determine a set of patterns that must be applied at the inputs to determine propagation characteristics of the SET that are meaningful for hardening purposes. The impact of the proposed method is experimentally verified on the ISCAS and ITC benchmarks.
A Monte Carlo based approach capable of identifying the probability distributions that describe the delay of every sensitizable path in a path implicit manner is proposed. It is shown experimentally that the statistical information for all paths is generated as fast as the traditional Monte Carlo simulation that identifies the probability density function for the circuit delay.
In recent work, the error latching probability due to an SET is calculated for a single observable point, and this help in hardening the design. This paper utilizes a recently proposed probabilistic framework for SET propagation in order to diagnose (on-line or off-line) the location and time of strike based on errors observed at multiple points. The proposed diagnostic framework requires a new approach...
In the current deep sub-micron technology, a small inaccuracy in computing the probability of occurrence of a soft error result in an unacceptably large chip failure rate. We propose a method that considers gate delays to determine accurately the probability of SET propagation resulting into an error. Disjoint covers of appropriately formulated functions are used for the probability computations in...
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