2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) > 104 - 108
Source
Abstract
Identifiers
book ISSN : | 1550-5774 |
book ISBN : | 978-1-4673-3043-5 |
book e-ISBN : | 978-1-4673-3044-2 , 978-1-4673-3042-8 |
DOI | 10.1109/DFT.2012.6378208 |