Search results for: Peitian Cong
Microelectronics Reliability > 2018 > 87 > C > 151-157
IEEE Transactions on Plasma Science > 2017 > 45 > 6 > 1004 - 1009
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 4 > 1978 - 1984
IEEE Transactions on Plasma Science > 2016 > 44 > 10-1 > 1984 - 1988
IEEE Transactions on Plasma Science > 2016 > 44 > 10-1 > 2040 - 2044
IEEE Transactions on Plasma Science > 2016 > 44 > 10-1 > 1928 - 1932
IEEE Transactions on Plasma Science > 2016 > 44 > 10-1 > 1902 - 1906
IEEE Transactions on Plasma Science > 2016 > 44 > 5 > 803 - 807
IEEE Transactions on Plasma Science > 2015 > 43 > 10-1 > 3359 - 3364
IEEE Transactions on Plasma Science > 2014 > 42 > 1 > 120 - 126
IEEE Transactions on Plasma Science > 2014 > 42 > 11 > 3598 - 3602
IEEE Transactions on Plasma Science > 2014 > 42 > 8 > 2086 - 2091
IEEE Transactions on Plasma Science > 2014 > 42 > 2 > 340 - 345
IEEE Transactions on Plasma Science > 2013 > 41 > 1 > 187 - 191
IEEE Transactions on Plasma Science > 2011 > 39 > 11-3 > 3227 - 3232
IEEE Transactions on Plasma Science > 2010 > 38 > 4-1 > 639 - 645